Applications from the field of Semiconductor Analysis - page 4

Detection of molecular ions from OLED material using AccuTOF GC

Applications

| 2006 | JEOL

GC/MSD, GC/TOF

Instrumentation

GC/MSD, GC/TOF

Manufacturer

JEOL

Industries

Materials Testing, Semiconductor Analysis

Thermal Desorption Analysis of Si Wafer Contaminants

Applications

| N/A | GL Sciences

GC/MSD, Thermal desorption, GC/SQ

Instrumentation

GC/MSD, Thermal desorption, GC/SQ

Manufacturer

Shimadzu, CTC Analytics, GL Sciences

Industries

Semiconductor Analysis

Phthalate Analysis in Accordance with an IEC Standard Method

Applications

| N/A | CDS Analytical

GC/MSD, Pyrolysis

Instrumentation

GC/MSD, Pyrolysis

Manufacturer

CDS Analytical

Industries

Semiconductor Analysis

The use of Kendrick mass defect plots, a new feature in GC Image™ software for GC x GC/high resolution mass spectrometric data analysis: an application on the identification of halogenated contaminants in electronic waste

Applications

| N/A | ZOEX/JSB

GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software

Instrumentation

GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software

Manufacturer

JEOL, ZOEX/JSB

Industries

Materials Testing, Semiconductor Analysis

On-Line Thermal Desorption Analysis As Replacement for Solvent Extraction Methods

Applications

| N/A | CDS Analytical

GC, Thermal desorption

Instrumentation

GC, Thermal desorption

Manufacturer

Buck Scientific, CDS Analytical

Industries

Semiconductor Analysis