Applications from the field of Materials Testing - page 19

Isomeric Separations of Cyclometalated Iridium (III) Complexes Using the ACQUITY UPC2 System

Applications

| 2012 | Waters

SFC

Instrumentation

SFC

Manufacturer

Waters

Industries

Materials Testing

Measuring diffuse refl ectance of solid samples with the Agilent Cary 60 UV-Vis

Applications

| 2012 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Measuring the reflectance of very small samples using the Agilent Cary 60 Remote Diffuse Reflectance Accessory (DRA)

Applications

| 2012 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

SEC-MALS of Silicones

Applications

| 2012 | Wyatt Technology (Waters)

GPC/SEC

Instrumentation

GPC/SEC

Manufacturer

Waters

Industries

Materials Testing

Analysis of Surfactants Using the Agilent 500 Ion Trap LC/MS

Applications

| 2011 | Agilent Technologies

LC/MS, LC/IT

Instrumentation

LC/MS, LC/IT

Manufacturer

Agilent Technologies

Industries

Materials Testing

Measuring the UV protection factor (UPF) of fabrics and clothing

Applications

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Characterizing sub-nanometer narrow bandpass filters using a Cary 400/500

Applications

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

The characterization of optical components using the Cary Deep UV spectrophotometer and ‘VW’ specular reflectance accessory

Applications

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

The deep ultraviolet spectroscopic properties of a next-generation photoresist

Applications

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis

Evaluation of the Cary Absolute Specular Reflectance accessory for the measurement of optical constants of thin films

Applications

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing