Analysis of Rubber components with EAG and EGA Polymer MS Library (EGA-MS LIB)
Applications
| N/A | Frontier Lab
GC/MSD, Thermal desorption, Pyrolysis, Software
Instrumentation
GC/MSD, Thermal desorption, Pyrolysis, Software
Manufacturer
Frontier Lab
Industries
Materials Testing
Forensic Discrimination of Fibers by Evolved Gas Analysis and Library Search by F-Search
Applications
| N/A | Frontier Lab
GC/MSD, Thermal desorption, Pyrolysis, Software
Instrumentation
GC/MSD, Thermal desorption, Pyrolysis, Software
Manufacturer
Frontier Lab
Industries
Forensics
Viability of Evolved Gas Analysis with F-Search and an MS Library for Qualitative Analysis of Rubber Products
Applications
| N/A | Frontier Lab
GC/MSD, Thermal desorption, Pyrolysis, Software
Instrumentation
GC/MSD, Thermal desorption, Pyrolysis, Software
Manufacturer
Frontier Lab
Industries
Materials Testing
Effect of hydrogen carrier gas on Py-GC/MS analysis of polymers Part 3 Library search using existing database
Applications
| N/A | Frontier Lab
GC/MSD, Pyrolysis, Software
Instrumentation
GC/MSD, Pyrolysis, Software
Manufacturer
Frontier Lab
Industries
Materials Testing
Characterization of 35 organic pigments using multi-functional pyrolysis (Py)-GC/MS and development of a database
Applications
| N/A | Frontier Lab
GC/MSD, Thermal desorption, Pyrolysis, Software
Instrumentation
GC/MSD, Thermal desorption, Pyrolysis, Software
Manufacturer
Frontier Lab
Industries
Energy & Chemicals
Identification of an unknown vulcanization accelerator in vulcanized rubber using F-Search and the Additive MS library
Applications
| N/A | Frontier Lab
GC/MSD, Thermal desorption, Software
Instrumentation
GC/MSD, Thermal desorption, Software
Manufacturer
Frontier Lab
Industries
Materials Testing
GCMSsolution (Part 2) – Creation of Compound Table using the Wizard Function –
Technical notes
| N/A | Shimadzu
Software
Instrumentation
Software
Manufacturer
Shimadzu
Industries
The use of Kendrick mass defect plots, a new feature in GC Image™ software for GC x GC/high resolution mass spectrometric data analysis: an application on the identification of halogenated contaminants in electronic waste
Applications
| N/A | ZOEX/JSB
GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software
Instrumentation
GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software
Manufacturer
JEOL, ZOEX/JSB
Industries
Materials Testing, Semiconductor Analysis
A complete solution using GCxGC/MS with GCMS-QP2020 and ChromSquare software