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WCPS: Application of Compound Independent Calibration (CIC) Software for the Quantitation of As-species in Undiluted Urine by LC-ICP-MS
Posters
| 2011 | Agilent Technologies
HPLC, ICP/MS, Speciation analysis
Instrumentation
HPLC, ICP/MS, Speciation analysis
Manufacturer
Agilent Technologies
Industries
Clinical Research
WCPS: Metal Release Analysis of the new 1260 Infinity Bio-inert HPLC System by 7700 ICP-MS
Posters
| 2011 | Agilent Technologies
HPLC, ICP/MS, Speciation analysis
Instrumentation
HPLC, ICP/MS, Speciation analysis
Manufacturer
Agilent Technologies
Industries
Optimum parameters for UV-VIS-NIR spectroscopy
Posters
| 2011 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
LL Column and L&L4000MPS - Site Preparation Checklist
Manuals
| 2011 | Agilent Technologies
Consumables, LC columns
Instrumentation
Consumables, LC columns
Manufacturer
Agilent Technologies
Industries
The Agilent Cary 60 eliminates photodegradation of aromatic markers used in UV-Vis spectrophotometric applications
Applications
| 2011 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals
Characterizing sub-nanometer narrow bandpass filters using a Cary 400/500
Applications
| 2011 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
The characterization of optical components using the Cary Deep UV spectrophotometer and ‘VW’ specular reflectance accessory
Applications
| 2011 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
The deep ultraviolet spectroscopic properties of a next-generation photoresist
Applications
| 2011 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis
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WebinarsAbout usContact usTerms of use
LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike