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Spectrophotometric Spatial Profiling of Coated Optical Wafers
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| 2020 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
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NIR Spectroscopy, UV–VIS spectrophotometry
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Agilent Technologies
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Materials Testing
Using ICP-MS/MS with M-Lens for the analysis of high silicon matrix samples
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| 2020 | Agilent Technologies (ASMS)
ICP/MS, ICP/MS/MS
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ICP/MS, ICP/MS/MS
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Agilent Technologies
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Semiconductor Analysis
High Sensitivity Determination of Lead in Soy sauce
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| 2020 | Agilent Technologies
AAS
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AAS
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Agilent Technologies
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Food & Agriculture
Measurement of 87Sr/86Sr Isotope Ratios in Rocks by ICP-QQQ in Mass-Shift Mode
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| 2020 | Agilent Technologies
ICP/MS, ICP/MS/MS
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ICP/MS, ICP/MS/MS
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Agilent Technologies
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Environmental
Direct Analysis of Zirconium-93 in Nuclear Site Decommissioning Samples by ICP-QQQ
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| 2020 | Agilent Technologies
ICP/MS, ICP/MS/MS
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ICP/MS, ICP/MS/MS
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Agilent Technologies
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Characterization of Rare Earth Elements used for Radiolabeling Applications by ICP-QQQ
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| 2020 | Agilent Technologies
ICP/MS, ICP/MS/MS
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ICP/MS, ICP/MS/MS
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Agilent Technologies
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Pharma & Biopharma
Support for Title 21 CFR Part 11 and Annex 11 Compliance: Agilent ICP Expert 21 CFR Part 11 software
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| 2020 | Agilent Technologies
Software, ICP-OES
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Software, ICP-OES
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Agilent Technologies
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Pharma & Biopharma
Agilent ICP-MS Journal (July 2020, Issue 81)
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| 2020 | Agilent Technologies
ICP/MS, ICP/MS/MS, Laser ablation
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ICP/MS, ICP/MS/MS, Laser ablation
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Agilent Technologies
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Environmental
Agilent ICP-MS Journal (January 2020, Issue 79)
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| 2020 | Agilent Technologies
Consumables, ICP/MS, ICP/MS/MS
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Consumables, ICP/MS, ICP/MS/MS
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Agilent Technologies
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Energy & Chemicals
14 Causes of Metals Analysis Failure
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| 2020 | Agilent Technologies
ICP-OES
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ICP-OES
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Agilent Technologies
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