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FTIR Letter Vol. 45
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| 2025 | Shimadzu
FTIR Spectroscopy
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FTIR Spectroscopy
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Shimadzu
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Materials Testing
Benchtop X-Ray CT System XSeeker 8000
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| 2025 | Shimadzu
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X-ray
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Shimadzu
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Trace Elemental Analysis of Precursor Materials Using ICP-MS/MS
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| 2025 | Agilent Technologies
ICP/MS, ICP/MS/MS
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ICP/MS, ICP/MS/MS
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Agilent Technologies
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Semiconductor Analysis
Multi-Elemental Analysis of Lithium Aluminum Titanium Phosphate by Automated ICP-OES
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| 2025 | Agilent Technologies
ICP-OES
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ICP-OES
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Agilent Technologies
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Semiconductor Analysis , Energy & Chemicals
Detecting Spice Adulteration with the Agilent 8700 LDIR Chemical Imaging System
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| 2025 | Agilent Technologies
FTIR Spectroscopy
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FTIR Spectroscopy
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Agilent Technologies
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Food & Agriculture
Thin Multilayer Analysis Using the Agilent 8700 LDIR Chemical Imaging System
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| 2025 | Agilent Technologies
FTIR Spectroscopy
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FTIR Spectroscopy
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Agilent Technologies
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Why switch to OMNIS Client/Server (C/S)?
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| 2025 | Metrohm
Software
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Software
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Metrohm
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Monitoring phosphate reactions in real time with Raman spectroscopy
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| 2025 | Metrohm
RAMAN Spectroscopy
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RAMAN Spectroscopy
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Metrohm
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Food & Agriculture
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