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Applications - page 58

Time of Flight Mass Spectrometry

Technical notes
| 2011 | Agilent Technologies
GC/MSD, GC/TOF, GC/Q-TOF, LC/TOF, LC/HRMS, LC/MS, LC/MS/MS
Instrumentation
GC/MSD, GC/TOF, GC/Q-TOF, LC/TOF, LC/HRMS, LC/MS, LC/MS/MS
Manufacturer
Agilent Technologies
Industries

Optimized Volatiles Analysis Ensures Fast VOC Separations

Technical notes
| 2011 | Restek
GC, GC/MSD, Purge and Trap, GC/SQ
Instrumentation
GC, GC/MSD, Purge and Trap, GC/SQ
Manufacturer
Agilent Technologies, Restek, OI Analytical
Industries
Environmental

New Alumina Column Shows Promise for Analysing Chlorofluorocarbons

Technical notes
| 2011 | Restek
GC columns, Consumables
Instrumentation
GC columns, Consumables
Manufacturer
Restek
Industries
Energy & Chemicals

Introducing Easy SamplePrep

Technical notes
| 2011 | Agilent Technologies
GC, Sample Preparation, Software
Instrumentation
GC, Sample Preparation, Software
Manufacturer
Agilent Technologies
Industries

Two dimensional chromatography: LC-GC online coupling of an Agilent 1260 Infinity LC and an Agilent 7890A GC

Technical notes
| 2011 | Agilent Technologies
GC, HPLC
Instrumentation
GC, HPLC
Manufacturer
Agilent Technologies
Industries

Why use Signal-To-Noise as a Measure of MS Performance When it is Often Meaningless?

Technical notes
| 2011 | Agilent Technologies
GC/MSD, LC/MS
Instrumentation
GC/MSD, LC/MS
Manufacturer
Industries

Using the GERSTEL Multi Purpose Sampler (MPS) as a large volume fraction collector

Technical notes
| 2011 | Anatune
Sample Preparation
Instrumentation
Sample Preparation
Manufacturer
Agilent Technologies, GERSTEL, Anatune
Industries
Other

Benefits of using sample enrichment techniques (Headspace SPME, Twister SBSE, and Dynamic headspace) to determine trace level analytes present in a herbal based liquor

Applications, Technical notes
| 2011 | Anatune
GC/MSD, HeadSpace, SPME, Sample Preparation, GC/SQ
Instrumentation
GC/MSD, HeadSpace, SPME, Sample Preparation, GC/SQ
Manufacturer
Agilent Technologies, GERSTEL, Anatune
Industries
Food & Agriculture

Imaging - what is it and how is it implemented?

Technical notes
| 2011 | Agilent Technologies
FTIR Spectroscopy, Microscopy
Instrumentation
FTIR Spectroscopy, Microscopy
Manufacturer
Agilent Technologies
Industries

Low reflectance measurements using the ‘VW’ technique

Technical notes
| 2011 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Other projects
GCMS
ICPMS
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LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike