Agilent Cary Universal Measurement Accessory (UMA)
Technical notes | 2013 | Agilent TechnologiesInstrumentation
The Cary Universal Measurement Accessory (UMA) expands the capabilities of UV-Vis and UV-Vis-NIR spectrophotometers by enabling fully automated, absolute measurements of specular reflectance, transmission and scattering over wide angular and spectral ranges. This functionality is critical in research and QA/QC workflows for thin films, coatings, optics, glass and solar energy materials. High accuracy and precision in angular control and polarization analysis lead to better product quality, reduced waste and lower manufacturing risks.
This technical overview presents the design and applications of the UMA accessory, which integrates seamlessly with Agilent Cary 4000/5000/6000i/7000 instruments. Key objectives include unattended measurement of absolute reflectance (5–85°), direct transmission (0–90°) and diffuse scattering, delivering deeper sample insights and higher throughput in both academic and industrial settings.
The UMA achieves high-accuracy absolute specular reflectance and transmission measurements with a single baseline for all angles and polarizations, significantly reducing collection time. Direct detection preserves full signal strength and supports absorptance calculations without moving the sample. Diffuse scattering is mapped via 360° sample rotation and detector positioning from 10° to 350°.
Emerging integration with data analytics and machine learning can further streamline measurement protocols and predictive QC. Adaptations for inline production monitoring, extended spectral coverage into the SWIR and modular custom mounts will address evolving research and industrial demands.
The Agilent Cary UMA transforms conventional spectrophotometry by providing precise, unattended multi-modal optical measurements. Its robust design and versatile instrumentation support enhanced productivity and data quality across academic research, industrial QC and solar energy development.
Agilent Technologies Technical Overview Publication number 5991-2529EN May 30 2013
NIR Spectroscopy, UV–VIS spectrophotometry
IndustriesManufacturerAgilent Technologies
Summary
Significance of the Topic
The Cary Universal Measurement Accessory (UMA) expands the capabilities of UV-Vis and UV-Vis-NIR spectrophotometers by enabling fully automated, absolute measurements of specular reflectance, transmission and scattering over wide angular and spectral ranges. This functionality is critical in research and QA/QC workflows for thin films, coatings, optics, glass and solar energy materials. High accuracy and precision in angular control and polarization analysis lead to better product quality, reduced waste and lower manufacturing risks.
Objectives and Overview
This technical overview presents the design and applications of the UMA accessory, which integrates seamlessly with Agilent Cary 4000/5000/6000i/7000 instruments. Key objectives include unattended measurement of absolute reflectance (5–85°), direct transmission (0–90°) and diffuse scattering, delivering deeper sample insights and higher throughput in both academic and industrial settings.
Methodology and Instrumentation
- Independent motorized movement of sample and detector enables multi-modal analysis without repositioning the sample.
- High-resolution optical encoders maintain angular reproducibility to 0.02° even after accidental bumps.
- Wire-grid polarizers and adjustable vertical (1°–3°) and horizontal (1°–6°) apertures control beam polarization and collimation.
- Direct-view dual Si/InGaAs detector covers 190–2800 nm without integrating spheres, preserving signal intensity.
- Sample mounts accommodate diameters from 5 mm to 275 mm and thicknesses up to 30 mm; optional holders extend flexibility.
Main Results and Discussion
The UMA achieves high-accuracy absolute specular reflectance and transmission measurements with a single baseline for all angles and polarizations, significantly reducing collection time. Direct detection preserves full signal strength and supports absorptance calculations without moving the sample. Diffuse scattering is mapped via 360° sample rotation and detector positioning from 10° to 350°.
Benefits and Practical Applications
- Increased QA/QC throughput and cost savings in coating and glass manufacturing.
- Automated analysis reduces human error and ensures consistent end-product quality.
- Advanced research tools for refractive index determination, film thickness modeling and plasmonic scattering studies.
- Solar industry testing for parabolic troughs, Fresnel reflectors and photovoltaic modules.
- Compliance verification to standards such as EN410, ISO9050 and EN13837.
Future Trends and Opportunities
Emerging integration with data analytics and machine learning can further streamline measurement protocols and predictive QC. Adaptations for inline production monitoring, extended spectral coverage into the SWIR and modular custom mounts will address evolving research and industrial demands.
Conclusion
The Agilent Cary UMA transforms conventional spectrophotometry by providing precise, unattended multi-modal optical measurements. Its robust design and versatile instrumentation support enhanced productivity and data quality across academic research, industrial QC and solar energy development.
Reference
Agilent Technologies Technical Overview Publication number 5991-2529EN May 30 2013
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