LCMS
More information
WebinarsAbout usContact usTerms of use
LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike

Suppressor «MACuSpec TM PPR 100 Wetter» in acid copper baths (MacDermid)

Applications |  | MetrohmInstrumentation
Voltammetry/Coulometry
Industries
Energy & Chemicals
Manufacturer
Metrohm

Summary

Significance of the topic


The accurate determination of organic suppressors such as MACuSpec™ PPR 100 Wetter in acid copper electroplating baths is critical for ensuring consistent deposit quality, bath stability and process efficiency. Reliable monitoring of suppressor concentration supports optimal throw power, minimizes defects and helps maintain plating performance in high-throughput industrial environments.

Study objectives and overview


This Application Note describes a combined dilution titration (DT) and cyclic voltammetric stripping (CVS) approach to quantify MACuSpec™ PPR 100 Wetter in acid copper baths. The goal is to establish a simple, accurate electroanalytical protocol compatible with standard bath compositions and routine quality control workflows.

Methodology


Sample Preparation:
  • Collect plating bath aliquot.
  • Perform a 1 : 10 dilution with the virgin make-up solution (VMS) containing CuSO₄, H₂SO₄ and HCl at supplier-specified concentrations.
CVS-Based Titration:
  • Use a rotating disk electrode (RDE) hydrodynamic setup at 2 000 rpm.
  • Scan potential from +1.575 V to –0.175 V and back at 0.1 V/s with 6 mV steps.
  • Detect copper stripping peak near +0.25 V, using the charge ratio Q/Q₀ = 0.5 for endpoint evaluation.

Instrumentation


  • Working Electrode: Platinum rotating disk electrode with interchangeable Pt tip (Drive shaft code 6.1246.000; CVS tip code 6.1204.160).
  • Auxiliary Electrode: Platinum wire (code 6.0343.000).
  • Reference Electrode: Ag/AgCl in 3 M KCl with H₂SO₄ (1 M) intermediate electrolyte (code 6.0728.020; intermediate code 6.1245.010).
  • Stirring and control via standard potentiostat/galvanostat compatible with RDE mode.

Main results and discussion


The titration curve demonstrates a clear linear relationship between added suppressor volume and the normalized stripping charge (Q/Q₀). The plotted cyclic voltammograms reveal well-defined copper stripping peaks, and the calibration delivers reproducible endpoints with ±0.25 V window. Sensitivity and precision meet industrial QC requirements for suppressor levels typical in acid copper baths.

Benefits and practical applications of the method


  • Rapid, on-site determination of suppressor concentration without complex sample workup.
  • High repeatability and clear electrochemical endpoint detection.
  • Minimal reagent consumption, leveraging existing bath make-up solutions.
  • Easy integration into routine bath analysis protocols for laboratories and plating shops.

Future trends and opportunities


Advances could include full automation of the DT-CVS workflow, miniaturized or flow-through electrochemical cells for inline monitoring, and coupling with digital process control systems. Exploring alternative electrode materials or advanced signal processing may further enhance sensitivity and reduce analysis time.

Conclusion


The described DT-CVS method provides a straightforward, accurate and cost-effective tool for quantifying MACuSpec™ PPR 100 Wetter in acid copper plating baths. Its robust performance and ease of use make it suitable for routine quality control, enabling tighter process control and improved deposit uniformity.

References


  • MacDermid. Application Note No. V-141, Version 1.0.

Content was automatically generated from an orignal PDF document using AI and may contain inaccuracies.

Downloadable PDF for viewing
 

Similar PDF

Toggle
Suppressor «Copper GleamTM 2001 Carrier» in acid copper baths (Rohm and Haas Electronic Materials)
VA Application Note No. V - 133 Title: Suppressor «Copper GleamTM 2001 Carrier» in acid copper baths (Rohm and Haas Electronic Materials) Summary: Determination of suppressor «Copper Gleam 2001 Carrier» in acid copper baths by dilution titration (DT) using cyclic…
Key words
vertex, vertexcopper, copperelectrode, electrodebaths, bathspotential, potentialrohm, rohmacid, acidrde, rdeworking, workingelectroplating, electroplatingvms, vmshaas, haascvs, cvsvirgin, virginhydrodynamic
Suppressor «Cupracid BL-CT» in acid copper baths (Atotech)
VA Application Note No. V - 135 Title: Suppressor «Cupracid BL-CT» in acid copper baths (Atotech) Summary: Determination of suppressor «Cupracid BL-CT» in acid copper baths by dilution titration (DT) using cyclic voltammetric stripping (CVS). Sample: Acid copper electroplating bath…
Key words
cupracid, cupracidsuppressor, suppressorvertex, vertexcopper, copperelectrode, electrodebaths, bathspotential, potentialatotech, atotechacid, acidrde, rdeworking, workingelectroplating, electroplatingvms, vmscvs, cvsvirgin
Suppressor «Thru-Cup EVF-B» in acid copper baths (Uyemura)
VA Application Note No. V - 155 Title: Suppressor «Thru-Cup EVF-B» in acid copper baths (Uyemura) Summary: Determination of suppressor «Thru-Cup EVF-B» in acid copper baths by dilution titration (DT) using cyclic voltammetric stripping (CVS). Sample: Acid copper electroplating bath…
Key words
evf, evfthru, thrucup, cupsuppressor, suppressorvertex, vertexcopper, copperelectrode, electrodebaths, bathspotential, potentialuyemura, uyemuraacid, acidrde, rdeworking, workingelectroplating, electroplatingvms
Suppressor «MultiBondTM 100 Part A20» in an acid copper bath (MacDermid)
VA Application Note No. V - 143 Title: Suppressor «MultiBondTM 100 Part A20» in an acid copper bath (MacDermid) Summary: Determination of suppressor «MultiBondTM 100 Part A20» in an acid copper bath by dilution titration (DT) using cyclic voltammetric stripping…
Key words
bath, bathvertex, vertexcopper, copperelectrode, electrodepotential, potentialmacdermid, macdermidacid, acidrde, rdeworking, workingelectroplating, electroplatingvms, vmscvs, cvsvirgin, virginhydrodynamic, hydrodynamicelectrolyte
Other projects
GCMS
ICPMS
Follow us
More information
WebinarsAbout usContact usTerms of use
LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike