Polymers and Rubbers Application Compendium

Importance of Topic

Polymer and rubber materials are used in advanced industries from aerospace to semiconductors. Precise analysis of composition, additives, surface morphology, and mechanical performance is essential for product development, quality control, and failure analysis. Agilent’s integrated solutions address these needs with spectroscopy, chromatography, microscopy, and mechanical testing technologies.

Study Overview

Case studies demonstrate applications of Agilent instruments for polymer and rubber analytics:

• FTIR spectroscopy (bench and handheld ATR) for quantitative copolymer composition, additive content, contaminant identification, and chemical imaging.
• Liquid and size-exclusion chromatography (LC, GPC/SEC) for profiling polymer additives and molecular weight distributions.
• Scanning probe microscopy (AFM, Kelvin force microscopy) and field-emission SEM for surface characterization of thin films, multilayer interfaces, and nanostructures.
• Nanoindentation and scratch testing for elastic modulus, hardness, and durability of coatings, low-k dielectrics, and polymer films, including elevated-temperature measurements.

Methodology and Instrumentation

FTIR ATR methods employ single-reflection diamond or germanium crystals on Agilent Cary systems and handheld ExoScan for nondestructive in-situ polymer identification. Agilent LC and SEC platforms with specialized columns quantify antioxidants, slip agents, phthalates, and UV filters. Agilent AFM systems (Cary 610, 5600LS) enable amplitude and frequency modulation imaging, single-pass KFM for surface potential mapping, environmental chambers for solvent and humidity studies, and mechanical testing via nanoindentation (G200/G300) and scratch (NP3 tip) modules.

Main Results and Discussion

FTIR ATR calibrations achieve R2 > 0.999 for copolymer content (SBR, PEVA, PE/PP blends) and additive quantification with LOD < 0.1 wt%. Handheld ATR allows rapid material ID of seals and rubbers. LC/SEC resolves polymer additives and molecular weight variations. AFM/KFM reveals local surface potential contrasts in semiconductor doping, organic self-assemblies, and polymer composites down to ~ 10 nm resolution. Environmental AFM visualizes humidity- and solvent-induced morphology changes. Nanoindentation measures Young’s modulus of low-k films (4.7–8.2 GPa) and scratch resistance of coatings, with performance at elevated temperatures verified.

Benefits and Practical Applications

Agilent’s solutions deliver:

• Fast, non-destructive, quantitative polymer QA/QC with FTIR ATR.
• High-sensitivity additive and copolymer profiling via LC and GPC/SEC.
• Nanoscale surface and defect mapping with AFM and KFM.
• Mechanical property evaluation of coatings and films by nanoindentation and scratch testing.
• Environmental monitoring of solvent and humidity effects on polymer assemblies.

Future Trends and Opportunities

Emerging advances include multifrequency AFM modes (AM-FM, FM-AM) for simultaneous mechanical/electric mapping, expanded environmental control (UHV, liquids, gases) for in-situ studies, combined chemical-mechanical imaging, and field-deployable spectroscopy instruments for process-line QA/QC. Continued development of ultra-sharp probes and automated platforms will further extend capabilities across polymer science and nanotechnology.

Conclusion

Agilent’s comprehensive portfolio of FTIR spectroscopy, chromatography, AFM/KFM, SEM, and nanoindentation provides end-to-end analytical solutions for polymer and rubber materials. These technologies enable high-precision, multiscale characterization to accelerate materials development, enhance product reliability, and optimize industrial processes.

References

• W.C. Oliver and G.M. Pharr, J. Mater. Res. 1992, 7, 1564–1583.
• M. Nakamura and T. Yamada, Roadmap of Scanning Probe Microscopy, Springer, 2006.
• ASTM D3900-05a, Rubber – Determination of Ethylene Units by IR Spectrometry, 2005.
• L. Fumagalli et al., Appl. Phys. Lett. 2010, 96, 183107.