Measuring and Analyzing Optical Coatings by UV-Vis-NIR

RECORD | Already taken place Fr, 22.9.2023
Techniques for determining film thickness, index of refraction, etc. through the use of a Cary 7000 UV-Vis-NIR system.
Agilent Technologies: Measuring and Analyzing Optical Coatings by UV-Vis-NIR

Agilent Technologies: Measuring and Analyzing Optical Coatings by UV-Vis-NIR

The Cary 7000 UV-Vis-NIR system can be used to collect high quality data which can then be used to characterize optical coatings.

We will examine the techniques for determining film thickness, index of refraction, etc. through the use of a Cary 7000 UV-Vis-NIR system.

Presenter: Mark Fisher, PhD (Application Engineer, Molecular Spectroscopy, Agilent Technologies, Inc.)

Mark, an Application Scientist for Agilent Technologies, has over 35 years of experience in molecular spectroscopy. He has held roles in Agilent's UV-Vis-NIR, fluorescence, and atomic absorption product portfolios. In addition to identifying industry trends and new business needs, Mark's responsibilities include application development, pre and post-sales support, as well as acting as a customer advocate for new product and technology opportunities. Mark received his doctorate in analytical chemistry from the University of Nebraska-Lincoln.

Agilent Technologies