Semicon e-Symposium 2024
Join us for the first-ever Semicon e-Symposium, a one-day virtual event featuring expert discussions on crucial topics in the semiconductor industry, including yield improvement, sustainability, PFAS analysis, and advanced analytical techniques.
Here’s why you don’t want to miss this:
- Discover how leading-edge analytical solutions are driving innovation, featuring a plenary talk by Dr. Stefanie Fingerhut from Merck KGaA on transforming semiconductor materials for mobile technology.
- Explore key advancements in vacuum technology and regulatory updates.
- Gain actionable insights from experts in GC-ICP-MS, UV-Vis spectroscopy, and a special talk by Inès Tendero from Technic France on the analysis of silicon in high-purity matrices.
This is a must-attend event for anyone looking to stay informed on key trends and cutting-edge advancements in semiconductor manufacturing.
Don’t miss out—register today!
Agenda
8:30 a.m. How Analytical Techniques Contribute to Yield Improvement and Environmental Sustainability in the Semiconductor Industry
- Gernot Hudin, Agilent Technologies
9:00 a.m. Plenary Talk: The Hidden Connection: Merck's Advanced Analytical Techniques Transforming Semiconductor Materials for Mobile Technology
- Dr. Stefanie Fingerhut, Merck KGaA
9:45 a.m. Agilent ICP-MS Supplies Selection Tips for the Semiconductor Industry
- Alain Desprez, Agilent Technologies
10:00 a.m. PFAS 'Forever Chemicals'—Forever a Problem?
- Shifen Xu, Agilent Technologies
10:30 a.m. Quantitative Workflow for the Analysis of PFAS in Semiconductor Lubricant with LC-MS (Q-TOF)
- Peter Kornas, Agilent Technologies
11:00 a.m. Agilent Vacuum in Semiconductor Market
- Fabio Ardissone, Agilent Technologies
11:30 a.m. GC, GC/MS, and GC-ICP-MS in Semiconductor: What, Why, and How?
- Stephane Decouflet, Agilent Technologies
12:00 p.m. Lunch break
1:00 p.m. Semiconductor Application of Single Particle ICP-MS
- Yoshinori Shimamura, Agilent Technologies
1:30 p.m. Is It Possible to Identify Organic Solvents by ICP-MS?
- Katsuo Mizobuchi, Agilent Technologies
2:00 p.m. Special talk: Analysis of Si in High-Purity Matrix for Semiconductor Application
- Inès Tendero, Technic France
2:30 p.m. Measuring the Band Gap Energy Using UV-Vis Spectroscopy
- Marcus Schulz, Agilent Technologies
2:45 p.m. Recap—closing session
- Gernot Hudin, Agilent Technologies
