Absolute Specular Reflectance made Easy in UV-Vis-NIR

An accessory to make absolute specular measurements for specific angles has been available for decades. It's limitation is that it is not easily adaptable to measuring absolute reflectance at any given angle. The Cary 7000 with its unique accessory design has changed the difficulty of the measurement from being a limitation to one of ease. Adding the desire to measure both reflectance and transmission at the same angle increases the design problem which previously was dealt with by using two accessories, one for reflectance and one for transmission. This approach led to uncertainties in knowing the measurements were being made on the same spot. This presentation will look at the design of an absolute reflectance accessory along with the ease of use to be able to collect absolute specular measurements at nearly any user desired angles.

Presenter: Scott Melis, PhD (Application Scientist, Agilent Technologies, Inc.)

Scott Melis has a PHD in Physics from Georgetown University in Washington, DC and started with Agilent in 2021 as a Molecular Spectroscopy Application Scientist. In his graduate work, Scott studied nanoparticle formation and growth for a variety of applications. Projects that he worked with include developing processes to deposit and characterize semiconducting molecular nano-cocrystals for use in optoelectronic devices as well as controlling polymer nanoparticle size through rapid mixing conditions.