Applications from the field of Semiconductor Analysis - page 1

Studying nickel deposition with EQCM-D and EC-Raman

Applications
| 2026 | Metrohm
RAMAN Spectroscopy, Electrochemistry, Voltammetry/Coulometry
Instrumentation
RAMAN Spectroscopy, Electrochemistry, Voltammetry/Coulometry
Manufacturer
Metrohm
Industries
Semiconductor Analysis

TOC and IC Measurements for Lithium Refining Processes

Applications
| 2025 | Shimadzu
TOC, Ion chromatography
Instrumentation
TOC, Ion chromatography
Manufacturer
Shimadzu
Industries
Semiconductor Analysis

Analysis of Organic Light-Emitting Diode (OLED) material

Applications
| 2024 | Shimadzu
SFC, Consumables, LC columns
Instrumentation
SFC, Consumables, LC columns
Manufacturer
Shimadzu
Industries
Semiconductor Analysis

Mott-Schottky Analysis

Applications
| 2024 | Metrohm
Electrochemistry
Instrumentation
Electrochemistry
Manufacturer
Metrohm
Industries
Semiconductor Analysis

Online analysis of organic additives in copper plating process

Applications
| 2024 | Metrohm
Electrochemistry
Instrumentation
Electrochemistry
Manufacturer
Metrohm
Industries
Energy & Chemicals , Semiconductor Analysis

Titration of phosphoric, nitric, and acetic acid mixtures

Applications
| 2023 | Metrohm
Titration
Instrumentation
Titration
Manufacturer
Metrohm
Industries
Semiconductor Analysis

Improved determinations of residual anions and organic acids to evaluate printed circuit board cleanliness

Applications
| 2023 | Thermo Fisher Scientific
Ion chromatography
Instrumentation
Ion chromatography
Manufacturer
Thermo Fisher Scientific
Industries
Semiconductor Analysis

Determination of anions on the surface of printed circuit boards by IPC-TM-650 Method 2.3.28 using HPIC

Applications
| 2022 | Thermo Fisher Scientific
Ion chromatography
Instrumentation
Ion chromatography
Manufacturer
Thermo Fisher Scientific
Industries
Semiconductor Analysis

Chloride in acidic copper baths

Applications
| 2020 | Metrohm
Titration
Instrumentation
Titration
Manufacturer
Metrohm
Industries
Energy & Chemicals , Semiconductor Analysis

Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements

Applications
| 2020 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis
Other projects
GCMS
ICPMS
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