Applications from the field of Semiconductor Analysis | LabRulez LCMS

Sub-ppb detection limits for hydride gas contaminants using GC-ICP-QQQ

Applications

| 2015 | Agilent Technologies

GC, Speciation analysis, ICP/MS/MS

Instrumentation

GC, Speciation analysis, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals , Semiconductor Analysis

Determination of Trace Impurities in Electronic Grade Arsine by GC-ICP-QQQ

Applications

| 2020 | Agilent Technologies

GC, ICP/MS, Speciation analysis, ICP/MS/MS

Instrumentation

GC, ICP/MS, Speciation analysis, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Quality Control of Laminates

Applications

| 2021 | Metrohm

NIR Spectroscopy

Instrumentation

NIR Spectroscopy

Manufacturer

Metrohm

Industries

Semiconductor Analysis

Quality control of semiconductor acid baths as per ASTM E1655 – Time- and cost-efficient with NIRS

Technical notes

| 2021 | Metrohm

NIR Spectroscopy

Instrumentation

NIR Spectroscopy

Manufacturer

Metrohm

Industries

Semiconductor Analysis

Measuring Inorganic Impurities in Semiconductor Manufacturing

Guides

| 2022 | Agilent Technologies

GC, ICP/MS, Speciation analysis, ICP/MS/MS

Instrumentation

GC, ICP/MS, Speciation analysis, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Ultrapure Process Chemicals Analysis by ICP-QQQ with Hot Plasma Conditions

Applications

| 2021 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Handbook of ICP-QQQ Applications using the Agilent 8800 and 8900

Guides

| 2022 | Agilent Technologies

GC, HPLC, ICP/MS, Speciation analysis, ICP/MS/MS

Instrumentation

GC, HPLC, ICP/MS, Speciation analysis, ICP/MS/MS

Manufacturer

Agilent Technologies, Elemental Scientific

Industries

Environmental, Food & Agriculture, Energy & Chemicals , Pharma & Biopharma, Materials Testing, Semiconductor Analysis , Clinical Research

Direct Measurement of Metallic Impurities in 20% Ammonium Hydroxide by 7700s/7900 ICP-MS

Applications

| 2017 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

WCPS: Ultratrace Analysis of Phosphorus, Boron and Other Impurities in Photovoltaic Silicon and Trichlorosilane by ICP-MS with High Energy Collision Cell

Posters

| 2011 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Quantitative analysis of high purity metals using laser ablation coupled to an Agilent 7900 ICP-MS

Applications

| 2015 | Agilent Technologies

ICP/MS, Laser ablation

Instrumentation

ICP/MS, Laser ablation

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals , Semiconductor Analysis

Applications from the field of Semiconductor Analysis | LabRulez LCMS

Sub-ppb detection limits for hydride gas contaminants using GC-ICP-QQQ

Determination of Trace Impurities in Electronic Grade Arsine by GC-ICP-QQQ

Quality Control of Laminates

Quality control of semiconductor acid baths as per ASTM E1655 – Time- and cost-efficient with NIRS

Measuring Inorganic Impurities in Semiconductor Manufacturing

Ultrapure Process Chemicals Analysis by ICP-QQQ with Hot Plasma Conditions

Handbook of ICP-QQQ Applications using the Agilent 8800 and 8900

Direct Measurement of Metallic Impurities in 20% Ammonium Hydroxide by 7700s/7900 ICP-MS

WCPS: Ultratrace Analysis of Phosphorus, Boron and Other Impurities in Photovoltaic Silicon and Trichlorosilane by ICP-MS with High Energy Collision Cell

Quantitative analysis of high purity metals using laser ablation coupled to an Agilent 7900 ICP-MS

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